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Information card for entry 1561562
Preview
| Coordinates | 1561562.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Cu2.06 O11 Ta4 |
|---|---|
| Calculated formula | Cu2.05 O11 Ta4 |
| Title of publication | Flux-mediated syntheses, structural characterization and low-temperature polymorphism of the p-type semiconductor Cu2Ta4O11 |
| Authors of publication | King, Nacole; Sullivan, Ian; Watkins-Curry, Pilanda; Chan, Julia Y.; Maggard, Paul A. |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2016 |
| Journal volume | 236 |
| Pages of publication | 10 - 18 |
| a | 10.7337 ± 0.0014 Å |
| b | 6.2506 ± 0.0003 Å |
| c | 12.8869 ± 0.0014 Å |
| α | 90° |
| β | 106.07 ± 0.004° |
| γ | 90° |
| Cell volume | 830.82 ± 0.15 Å3 |
| Ambient diffraction temperature | 300 K |
| Ambient diffracton pressure | 100 kPa |
| Number of distinct elements | 3 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Weighted residual factors for significantly intense reflections | 0.08587 |
| RFsqd | 0.09653 |
| Goodness-of-fit parameter for all reflections | 2.517 |
| Method of determination | powder diffraction |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.5406 Å |
| Diffraction radiation type | Kα~1,2~ |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 263977 (current) | 2021-04-08 | cif/ Adding structures of 1561562 via cif-deposit CGI script. |
1561562.cif |
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Users of the data should acknowledge the original authors of the
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