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Information card for entry 1561591
Preview
| Coordinates | 1561591.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | La9.48 O26 Si5.89 |
|---|---|
| Calculated formula | La9.484 O26 Si5.886 |
| Title of publication | Well-aligned polycrystalline lanthanum silicate oxyapatite grown by reactive diffusion between solid La2SiO5 and gases [SiO+1/2O2] |
| Authors of publication | Fukuda, Koichiro; Hasegawa, Ryo; Kitagawa, Takuya; Nakamori, Hiroshi; Asaka, Toru; Berghout, Abid; Béchade, Emilie; Masson, Olivier; Jouin, Jenny; Thomas, Philippe |
| Journal of publication | Journal of Solid State Chemistry |
| Year of publication | 2016 |
| Journal volume | 235 |
| Pages of publication | 1 - 6 |
| a | 9.7205 ± 0.0013 Å |
| b | 9.7205 ± 0.0013 Å |
| c | 7.1987 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 589.06 ± 0.14 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 3 |
| Space group number | 176 |
| Hermann-Mauguin space group symbol | P 63/m |
| Hall space group symbol | -P 6c |
| Residual factor for all reflections | 0.0273 |
| Residual factor for significantly intense reflections | 0.0169 |
| Weighted residual factors for significantly intense reflections | 0.0201 |
| Weighted residual factors for all reflections included in the refinement | 0.0215 |
| Goodness-of-fit parameter for significantly intense reflections | 1.17 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.12 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 264002 (current) | 2021-04-09 | cif/ Adding structures of 1561591 via cif-deposit CGI script. |
1561591.cif |
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Users of the data should acknowledge the original authors of the
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