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Information card for entry 1565156
Preview
| Coordinates | 1565156.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C43 H47 Ir N2 P S |
|---|---|
| Calculated formula | C43 H47 Ir N2 P S |
| SMILES | [Ir]12345([S]=C(c6n1c(C)c(c6C)CC)Nc1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[c]1([c]2([c]3(C)[c]4([c]51C)C)C)C |
| Title of publication | Pyrrole thioamide complexes of organo-rhodium(III), -iridium(III) and -ruthenium(II) |
| Authors of publication | Tang, Haiming; Saunders, Graham C.; Raymond, Onyekachi; Ma, Xiaochuan; Henderson, William |
| Journal of publication | Inorganica Chimica Acta |
| Year of publication | 2020 |
| Journal volume | 506 |
| Pages of publication | 119545 |
| a | 9.41539 ± 0.00011 Å |
| b | 21.3926 ± 0.0002 Å |
| c | 18.2604 ± 0.0002 Å |
| α | 90° |
| β | 101.762 ± 0.0012° |
| γ | 90° |
| Cell volume | 3600.77 ± 0.07 Å3 |
| Cell temperature | 101 ± 2 K |
| Ambient diffraction temperature | 101 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0338 |
| Residual factor for significantly intense reflections | 0.0256 |
| Weighted residual factors for significantly intense reflections | 0.06 |
| Weighted residual factors for all reflections included in the refinement | 0.064 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0222 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 270559 (current) | 2021-11-10 | cif/ Adding structures of 1565156 via cif-deposit CGI script. |
1565156.cif |
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Users of the data should acknowledge the original authors of the
structural data.