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Information card for entry 2022864
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| Coordinates | 2022864.cif |
|---|---|
| Structure factors | 2022864.hkl |
| Original IUCr paper | HTML |
| Chemical name | Silicon pernitride |
|---|---|
| Formula | N2 Si |
| Calculated formula | N2 Si |
| Title of publication | Synthesis and crystal structure of silicon pernitride SiN2 at 140 GPa |
| Authors of publication | Jurzick, Pascal L.; Krach, Georg; Brüning, Lukas; Schnick, Wolfgang; Bykov, Maxim |
| Journal of publication | Acta Crystallographica Section E Crystallographic Communications |
| Year of publication | 2023 |
| Journal volume | 79 |
| Journal issue | 10 |
| a | 4.1205 ± 0.0005 Å |
| b | 4.1205 ± 0.0005 Å |
| c | 4.1205 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 69.96 ± 0.015 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 2 |
| Space group number | 205 |
| Hermann-Mauguin space group symbol | P a -3 |
| Hall space group symbol | -P 2ac 2ab 3 |
| Residual factor for all reflections | 0.1285 |
| Residual factor for significantly intense reflections | 0.0706 |
| Weighted residual factors for significantly intense reflections | 0.1601 |
| Weighted residual factors for all reflections included in the refinement | 0.1907 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.072 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.28457 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 286429 (current) | 2023-09-20 | cif/ hkl/ Adding structures of 2022864 via cif-deposit CGI script. |
2022864.cif 2022864.hkl |
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Users of the data should acknowledge the original authors of the
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