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Information card for entry 2023364
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Coordinates | 2023364.cif |
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Original IUCr paper | HTML |
Common name | 5,10-Bis(phenylsulfonyl)tetrahydrodibenzopentalene |
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Chemical name | 8,16-Bis(benzenesulfonyl)tetracyclo[7.7.0.0^2,7^.0^10,15^]hexadeca-2,4,6,10(15),11,13-hexaene |
Formula | C28 H22 O4 S2 |
Calculated formula | C28 H22 O4 S2 |
Title of publication | Synthesis and crystal structure of 5,10-bis(phenylsulfonyl)tetrahydrodibenzopentalene |
Authors of publication | Sakami, Toshiki; Watanabe, Hikaru; Sato, Takuma; Okuda, Yasuhiro; Wakamatsu, Kan; Akashi, Haruo; Orita, Akihiro |
Journal of publication | Acta Crystallographica Section E Crystallographic Communications |
Year of publication | 2025 |
Journal volume | 81 |
Journal issue | 2 |
a | 17.2598 ± 0.0003 Å |
b | 10.0898 ± 0.0001 Å |
c | 13.181 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2295.44 ± 0.06 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.0346 |
Residual factor for significantly intense reflections | 0.0306 |
Weighted residual factors for significantly intense reflections | 0.0796 |
Weighted residual factors for all reflections included in the refinement | 0.0878 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.125 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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297519 (current) | 2025-01-29 | cif/ Adding structures of 2023364 via cif-deposit CGI script. |
2023364.cif |
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