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Information card for entry 2242746
Preview
Coordinates | 2242746.cif |
---|---|
Structure factors | 2242746.hkl |
Original IUCr paper | HTML |
Chemical name | (4-Methoxyphenyl)[2-(methylsulfanyl)thiophen-3-yl]methanone |
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Formula | C13 H12 O2 S2 |
Calculated formula | C13 H12 O2 S2 |
SMILES | s1ccc(c1SC)C(=O)c1ccc(OC)cc1 |
Title of publication | Synthesis, molecular structure and Hirshfeld surface analysis of (4-methoxyphenyl)[2-(methylsulfanyl)thiophen-3-yl]methanone |
Authors of publication | Nagaraju, S.; Sridhar, M. A.; Pradeepa Kumara, C.S.; Sadashiva, M. P.; Lakshminarayana, B. N.; Lokanath, N. K. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2018 |
Journal volume | 74 |
Journal issue | 12 |
Pages of publication | 1800 - 1803 |
a | 7.806 ± 0.004 Å |
b | 8.263 ± 0.003 Å |
c | 10.414 ± 0.006 Å |
α | 97.26 ± 0.011° |
β | 109.65 ± 0.02° |
γ | 93.79 ± 0.02° |
Cell volume | 623.3 ± 0.5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0513 |
Residual factor for significantly intense reflections | 0.0464 |
Weighted residual factors for significantly intense reflections | 0.1234 |
Weighted residual factors for all reflections included in the refinement | 0.1284 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.087 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
212036 (current) | 2018-11-17 | cif/ hkl/ Adding structures of 2242746 via cif-deposit CGI script. |
2242746.cif 2242746.hkl |
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