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Information card for entry 2242752
Preview
Coordinates | 2242752.cif |
---|---|
Structure factors | 2242752.hkl |
Original IUCr paper | HTML |
Chemical name | 2,4,6,11-Tetrakis(4-fluorophenyl)-9-oxa-1,5-diazatricyclo[5.3.1.0^3.8^]undecane |
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Formula | C32 H26 F4 N2 O |
Calculated formula | C32 H26 F4 N2 O |
SMILES | Fc1ccc([C@H]2N[C@@H](c3ccc(F)cc3)[C@H]3[C@@H](N4[C@@H]([C@@H]2C3OC4)c2ccc(F)cc2)c2ccc(F)cc2)cc1 |
Title of publication | Crystal structure and Hirshfeld surface analysis of 2,4,6,11-tetrakis(4-fluorophenyl)-9-oxa-1,5-diazatricyclo[5.3.1.0^3.8^]undecane |
Authors of publication | Vengatesh, G.; Sundaravadivelu, M.; Swinton Darious, Robert |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2018 |
Journal volume | 74 |
Journal issue | 12 |
Pages of publication | 1867 - 1871 |
a | 13.5712 ± 0.0008 Å |
b | 9.5161 ± 0.0006 Å |
c | 20.1543 ± 0.0013 Å |
α | 90° |
β | 99.357 ± 0.002° |
γ | 90° |
Cell volume | 2568.2 ± 0.3 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0624 |
Residual factor for significantly intense reflections | 0.0424 |
Weighted residual factors for significantly intense reflections | 0.0991 |
Weighted residual factors for all reflections included in the refinement | 0.1167 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
Revision | Date | Message | Files |
---|---|---|---|
212138 (current) | 2018-11-23 | cif/ hkl/ Adding structures of 2242752 via cif-deposit CGI script. |
2242752.cif 2242752.hkl |
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Users of the data should acknowledge the original authors of the
structural data.