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Information card for entry 2300668
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| Coordinates | 2300668.cif |
|---|---|
| Structure factors | 2300668.hkl |
| Original paper (by DOI) | HTML |
| Formula | O24 Si12 |
|---|---|
| Calculated formula | O24 Si12 |
| Title of publication | <i>InsteaDMatic</i>: towards cross-platform automated continuous rotation electron diffraction |
| Authors of publication | Roslova, Maria; Smeets, Stef; Wang, Bin; Thersleff, Thomas; Xu, Hongyi; Zou, Xiaodong |
| Journal of publication | Journal of Applied Crystallography |
| Year of publication | 2020 |
| Journal volume | 53 |
| Journal issue | 5 |
| Pages of publication | 1217 - 1224 |
| a | 20.022 ± 0.004 Å |
| b | 19.899 ± 0.004 Å |
| c | 13.383 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5332 ± 1.9 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.2612 |
| Residual factor for significantly intense reflections | 0.1992 |
| Weighted residual factors for significantly intense reflections | 0.5092 |
| Weighted residual factors for all reflections included in the refinement | 0.5465 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.583 |
| Diffraction radiation wavelength | 0.019 Å |
| Diffraction radiation type | 300kVelectrons |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 258187 (current) | 2020-10-07 | cif/ Updating files of 2300668, 2300669 Original log message: Adding full bibliography for 2300668--2300669.cif. |
2300668.cif 2300668.hkl |
| 255586 | 2020-08-22 | cif/ hkl/ Adding structures of 2300668, 2300669 via cif-deposit CGI script. |
2300668.cif 2300668.hkl |
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Users of the data should acknowledge the original authors of the
structural data.