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Information card for entry 2300693
Preview
| Coordinates | 2300693.cif |
|---|---|
| Structure factors | 2300693.hkl |
| Original paper (by DOI) | HTML |
| Formula | C4 Co Sc3 |
|---|---|
| Calculated formula | C4 Co Sc3 |
| Title of publication | HTD2: a single-crystal X-ray diffractometer for combined high-pressure/low-temperature experiments at laboratory scale |
| Authors of publication | Fischer, Andreas; Langmann, Jan; Vöst, Marcel; Eickerling, Georg; Scherer, Wolfgang |
| Journal of publication | Journal of Applied Crystallography |
| Year of publication | 2022 |
| Journal volume | 55 |
| Journal issue | 5 |
| a | 5.53 ± 0.0004 Å |
| b | 11.9606 ± 0.0015 Å |
| c | 5.535 ± 0.0006 Å |
| α | 90° |
| β | 104.508 ± 0.003° |
| γ | 90° |
| Cell volume | 354.42 ± 0.06 Å3 |
| Cell temperature | 2 ± 0.3 K |
| Ambient diffraction temperature | 2 ± 0.3 K |
| Number of distinct elements | 3 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0583 |
| Residual factor for significantly intense reflections | 0.0583 |
| Weighted residual factors for significantly intense reflections | 0.1427 |
| Weighted residual factors for all reflections included in the refinement | 0.1427 |
| Goodness-of-fit parameter for significantly intense reflections | 2.26 |
| Goodness-of-fit parameter for all reflections included in the refinement | 2.26 |
| Diffraction radiation wavelength | 0.56089 Å |
| Diffraction radiation type | AgKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 278264 (current) | 2022-09-29 | cif/ hkl/ Adding structures of 2300693, 2300694 via cif-deposit CGI script. |
2300693.cif 2300693.hkl |
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Users of the data should acknowledge the original authors of the
structural data.