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Information card for entry 2312296
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Coordinates | 2312296.cif |
---|---|
Original IUCr paper | HTML |
Common name | natrolite |
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Formula | Al2 H4 Na2 O12 Si3 |
Calculated formula | Al2 H4 Na2 O12 Si3 |
Title of publication | Optimal estimated standard uncertainties of reflection intensities for kinematical refinement from 3D electron diffraction data |
Authors of publication | Khouchen, Malak; Klar, Paul Benjamin; Chintakindi, Hrushikesh; Suresh, Ashwin; Palatinus, Lukas |
Journal of publication | Acta Crystallographica Section A Foundations and Advances |
Year of publication | 2023 |
Journal volume | 79 |
Journal issue | 5 |
Pages of publication | 427 - 439 |
a | 18.2872 ± 0.0011 Å |
b | 18.666 ± 0.0014 Å |
c | 6.6222 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2260.5 ± 0.2 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 5 |
Space group number | 43 |
Hermann-Mauguin space group symbol | F d d 2 |
Hall space group symbol | F 2 -2d |
Residual factor for all reflections | 0.172 |
Residual factor for significantly intense reflections | 0.1458 |
Weighted residual factors for significantly intense reflections | 0.3033 |
Weighted residual factors for all reflections included in the refinement | 0.3052 |
Goodness-of-fit parameter for significantly intense reflections | 7.8689 |
Goodness-of-fit parameter for all reflections included in the refinement | 6.2593 |
Diffraction radiation probe | electron |
Diffraction radiation wavelength | 0.0251 Å |
Diffraction radiation type | electrons200keV |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
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286386 (current) | 2023-09-18 | cif/ Adding structures of 2312286, 2312287, 2312288, 2312289, 2312290, 2312291, 2312292, 2312293, 2312294, 2312295, 2312296, 2312297, 2312298, 2312299, 2312300 via cif-deposit CGI script. |
2312296.cif |
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Users of the data should acknowledge the original authors of the
structural data.