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Information card for entry 2312362
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| Coordinates | 2312362.cif |
|---|---|
| Structure factors | 2312362.hkl |
| Original IUCr paper | HTML |
| Chemical name | Tetraaluminium diruthenium pentasilicon |
|---|---|
| Formula | Al4.09 Ru2 Si4.91 |
| Calculated formula | Al4.09 Ru2 Si4.91 |
| Title of publication | Crystal structures of five compounds in the aluminium-ruthenium-silicon system. |
| Authors of publication | Kitahara, Koichi; Takakura, Hiroyuki; Iwasaki, Yutaka; Kimura, Kaoru |
| Journal of publication | Acta crystallographica. Section E, Crystallographic communications |
| Year of publication | 2023 |
| Journal volume | 79 |
| Journal issue | Pt 10 |
| Pages of publication | 946 - 951 |
| a | 8.63058 ± 0.00014 Å |
| b | 8.79888 ± 0.00015 Å |
| c | 17.462 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1326.05 ± 0.04 Å3 |
| Cell temperature | 300.7 ± 0.2 K |
| Ambient diffraction temperature | 300.7 ± 0.2 K |
| Number of distinct elements | 3 |
| Space group number | 63 |
| Hermann-Mauguin space group symbol | C m c m |
| Hall space group symbol | -C 2c 2 |
| Residual factor for all reflections | 0.0111 |
| Residual factor for significantly intense reflections | 0.0105 |
| Weighted residual factors for significantly intense reflections | 0.0268 |
| Weighted residual factors for all reflections included in the refinement | 0.027 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.311 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
| Revision | Date | Message | Files |
|---|---|---|---|
| 287825 (current) | 2023-11-28 | cif/ hkl/ Adding structures of 2312358, 2312359, 2312360, 2312361, 2312362 via cif-deposit CGI script. |
2312362.cif 2312362.hkl |
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Users of the data should acknowledge the original authors of the
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