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Information card for entry 4001650
Preview
Coordinates | 4001650.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | Bi4 Cs0.8 Se0.72 Te5.28 |
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Calculated formula | Bi4 Cs0.804 Se0.72 Te5.28 |
Title of publication | Sb and Se Substitution in CsBi4Te6: The Semiconductors CsM4Q6(M = Bi, Sb; Q = Te, Se), Cs2Bi10Q15, and CsBi5Q8 |
Authors of publication | Chung, Duck Young; Uher, Ctirad; Kanatzidis, Mercouri G. |
Journal of publication | Chemistry of Materials |
Year of publication | 2012 |
Journal volume | 24 |
Journal issue | 10 |
Pages of publication | 1854 |
a | 63.677 ± 0.011 Å |
b | 4.3157 ± 0.0008 Å |
c | 14.387 ± 0.003 Å |
α | 90° |
β | 101.483 ± 0.002° |
γ | 90° |
Cell volume | 3874.6 ± 1.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 12 |
Hermann-Mauguin space group symbol | C 1 2/m 1 |
Hall space group symbol | -C 2y |
Residual factor for all reflections | 0.099 |
Residual factor for significantly intense reflections | 0.0659 |
Weighted residual factors for significantly intense reflections | 0.1709 |
Weighted residual factors for all reflections included in the refinement | 0.1851 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
176467 (current) | 2016-02-16 | cif/ (antanas@kurmis) Replacing _[local]_cod_* tags with their equivalents from the COD CIF dictionary in multiple entries in range 4. |
4001650.cif |
91935 | 2013-12-29 | cod/ (saulius@koala.ibt.lt) Adding DOIs that could be assigned unambiguously to the rest of COD CIFs. |
4001650.cif |
59746 | 2012-06-13 | cif/ Adding structures of 4001648, 4001649, 4001650, 4001651 via cif-deposit CGI script. |
4001650.cif |
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Users of the data should acknowledge the original authors of the
structural data.