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Information card for entry 4127248
Preview
| Coordinates | 4127248.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C27 H21 Cl6 N3 O18 Tb2 |
|---|---|
| Calculated formula | C27 H21 Cl6 N3 O18 Tb2 |
| Title of publication | Direct Radiation Detection by a Semiconductive Metal-Organic Framework. |
| Authors of publication | Wang, Yaxing; Liu, Xin; Li, Xiaoyan; Zhai, Fuwan; Yan, Siqi; Liu, Ning; Chai, Zhifang; Xu, Yadong; Ouyang, Xiaoping; Wang, Shuao |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2019 |
| a | 10.703 ± 0.003 Å |
| b | 16.17 ± 0.005 Å |
| c | 22.076 ± 0.006 Å |
| α | 90° |
| β | 92.57 ± 0.008° |
| γ | 90° |
| Cell volume | 3816.8 ± 1.9 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0672 |
| Residual factor for significantly intense reflections | 0.0495 |
| Weighted residual factors for significantly intense reflections | 0.1145 |
| Weighted residual factors for all reflections included in the refinement | 0.1214 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 215095 (current) | 2019-05-13 | cif/ Adding structures of 4127248 via cif-deposit CGI script. |
4127248.cif |
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