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Information card for entry 7128938
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Coordinates | 7128938.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | (C16H72N2)WS4 |
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Formula | C32 H72 N2 S4 W |
Calculated formula | C32 H72 N2 S4 W |
Title of publication | Tungsten disulfide thin films <i>via</i> electrodeposition from a single source precursor. |
Authors of publication | Thomas, Shibin; Greenacre, Victoria K.; Smith, Danielle E.; Noori, Yasir J.; Abdelazim, Nema M.; Hector, Andrew L.; de Groot, C. H. Kees; Levason, William; Bartlett, Philip N.; Reid, Gillian |
Journal of publication | Chemical communications (Cambridge, England) |
Year of publication | 2021 |
Journal volume | 57 |
Journal issue | 79 |
Pages of publication | 10194 - 10197 |
a | 35.5582 ± 0.0006 Å |
b | 28.7216 ± 0.0005 Å |
c | 15.5658 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 15897.2 ± 0.6 Å3 |
Cell temperature | 100.01 ± 0.1 K |
Ambient diffraction temperature | 100.01 ± 0.1 K |
Number of distinct elements | 5 |
Space group number | 43 |
Hermann-Mauguin space group symbol | F d d 2 |
Hall space group symbol | F 2 -2d |
Residual factor for all reflections | 0.0623 |
Residual factor for significantly intense reflections | 0.0572 |
Weighted residual factors for significantly intense reflections | 0.1408 |
Weighted residual factors for all reflections included in the refinement | 0.1446 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
Revision | Date | Message | Files |
---|---|---|---|
270365 (current) | 2021-11-06 | cif/ Updating files of 7128938 Original log message: Adding full bibliography for 7128938.cif. |
7128938.cif |
268446 | 2021-09-04 | cif/ Adding structures of 7128938 via cif-deposit CGI script. |
7128938.cif |
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