#------------------------------------------------------------------------------ #$Date: 2014-07-12 11:06:43 +0300 (Sat, 12 Jul 2014) $ #$Revision: 120115 $ #$URL: file:///home/coder/svn-repositories/cod/cif/9/01/61/9016116.cif $ #------------------------------------------------------------------------------ # # This file is available in the Crystallography Open Database (COD), # http://www.crystallography.net/. The original data for this entry # were provided the American Mineralogist Crystal Structure Database, # http://rruff.geo.arizona.edu/AMS/amcsd.php # # The file may be used within the scientific community so long as # proper attribution is given to the journal article from which the # data were obtained. # data_9016116 loop_ _publ_author_name 'Yamazaki, S.' 'Toraya, H.' _publ_section_title ; Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo ; _journal_name_full 'Journal of Applied Crystallography' _journal_page_first 51 _journal_page_last 59 _journal_volume 32 _journal_year 1999 _chemical_compound_source Synthetic _chemical_formula_sum 'Mg0.6 Mn1.4 O4 Si' _chemical_name_mineral Tephroite _space_group_IT_number 62 _symmetry_space_group_name_Hall '-P 2ac 2n' _symmetry_space_group_name_H-M 'P n m a' _cell_angle_alpha 90 _cell_angle_beta 90 _cell_angle_gamma 90 _cell_length_a 10.52411 _cell_length_b 6.17903 _cell_length_c 4.83927 _cell_volume 314.692 _database_code_amcsd 0019691 _exptl_crystal_density_diffrn 3.875 _[local]_cod_chemical_formula_sum_orig '(Mn1.4 Mg.6) Si O4' _cod_database_code 9016116 loop_ _space_group_symop_operation_xyz x,y,z x,1/2-y,z -x,1/2+y,-z 1/2-x,1/2+y,1/2+z 1/2+x,1/2-y,1/2-z 1/2+x,y,1/2-z 1/2-x,-y,1/2+z -x,-y,-z loop_ _atom_site_label _atom_site_fract_x _atom_site_fract_y _atom_site_fract_z _atom_site_occupancy _atom_site_U_iso_or_equiv MnM1 0.00000 0.00000 0.00000 0.48900 0.00874 MgM1 0.00000 0.00000 0.00000 0.51100 0.00874 MnM2 0.28010 0.25000 0.98780 0.91100 0.01102 MgM2 0.28010 0.25000 0.98780 0.08900 0.01102 Si 0.09390 0.25000 0.42480 1.00000 0.00760 O1 0.08900 0.25000 0.75640 1.00000 0.01165 O2 0.45190 0.25000 0.21810 1.00000 0.00899 O3 0.16050 0.03940 0.28240 1.00000 0.00861 _journal_paper_doi 10.1107/S0021889898010206