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Information card for entry 4003941
Preview
| Coordinates | 4003941.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | O232 Si116 |
|---|---|
| Calculated formula | O232 Si116 |
| Title of publication | EMM-25: The Structure of Two-Dimensional 11 ×10 Medium-Pore Borosilicate Zeolite Unraveled Using 3D Electron Diffraction |
| Authors of publication | Cho, Jung; Yun, Yifeng; Xu, Hongyi; Sun, Junliang; Burton, Allen W.; Strohmaier, Karl G.; Terefenko, Gene; Vroman, Hilda; Afeworki, Mobae; Cao, Guang; Wang, Hao; Zou, Xiaodong; Willhammar, Tom |
| Journal of publication | Chemistry of Materials |
| Year of publication | 2021 |
| a | 11.055 ± 0.002 Å |
| b | 22.912 ± 0.005 Å |
| c | 24.914 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6311 ± 2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 63 |
| Hermann-Mauguin space group symbol | C m c m |
| Hall space group symbol | -C 2c 2 |
| Residual factor for all reflections | 0.2133 |
| Residual factor for significantly intense reflections | 0.1938 |
| Weighted residual factors for significantly intense reflections | 0.4486 |
| Weighted residual factors for all reflections included in the refinement | 0.4635 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.685 |
| Diffraction radiation wavelength | 0.02508 Å |
| Diffraction radiation type | electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 265313 (current) | 2021-05-19 | cif/ Adding structures of 4003941 via cif-deposit CGI script. |
4003941.cif |
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